| 摘要 |
A method of adjusting the distance between the surface of a sample (2) on an adjustable sample support plate (1) and a first acceleration electrode (3) in an ion source for a time-of-flight mass spectrometer. A digital camera (9, 10) is used for viewing the sample and by analysis of the images produced by the camera, the position of the sample surface relative to the camera can be determined, and in response to this determination, the position of the sample surface can be adjusted in respect to the accelerating electrode. The image analysis include determining the position of the line of best focus in the image of the digital camera, or the determination of the lateral displacement of a light pattern projected onto the sample surface at a non-perpendicular angle, or the determination of the sample thickness. The movement device for the adjustment of the sample position can be combined with a pivot. |
