发明名称 Method of manufacturing a transistor
摘要 The method involves forming a stack with a semiconductor substrate (112) in which a dielectric layer (106), gate layer (104) and mask layer are arranged, and forming an etching mask (102) from the mask layer. The gate layer is etched along the mask. Ionic implantation is performed in a substrate part uncovered by the gate layer. The mask is trimmed on a length equal to a gate length of a transistor (100). An etching mask (120) is formed on the gate layer. The former mask is retracted. The gate layer is etched along the latter mask. Ionic implantation is performed on another substrate part.
申请公布号 EP1959481(A1) 申请公布日期 2008.08.20
申请号 EP20080101468 申请日期 2008.02.11
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 CLAVELIER, LAURENT;MAYER, FREDERIC;VINET, MAUD;DELEONIBUS, SIMON
分类号 H01L21/28 主分类号 H01L21/28
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