发明名称 METHOD OF FORMING AN IMPURITY REGION
摘要 A method of forming an impurity region is provided to prevent a substrate from being damaged by forming a source and drain of an LDD(Lightly Doped Drain) structure with a spacer. A method of forming an impurity region includes the steps of: forming a first pattern with a first line width on a substrate(100); forming a first impurity region(108) with a first impurity concentration on the surface of the substrate by using the first pattern as an ion implantation mask; forming a second pattern(112) with a second line width by etching the first pattern, wherein the second line width is smaller than the first line width; and forming a second impurity region with a second impurity concentration(110) on the surface of the substrate by using the second pattern as an ion implantation mask, wherein the second impurity concentration is thinner than the first impurity concentration.
申请公布号 KR20080076415(A) 申请公布日期 2008.08.20
申请号 KR20070016282 申请日期 2007.02.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOO, CHANG YEON;LEE, WON JUN;YOON, BYOUNG MOON;LEE, HYO JIN;MIN, CHUNG KI;KIM, TAE EUN
分类号 H01L21/22 主分类号 H01L21/22
代理机构 代理人
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