SEMICONDUCTOR DEVICE INCLUDING A PLURALITY OF MEMORY UNITS AND METHOD FOR TESTING THE SEMICONDUCTOR DEVICE

摘要

A semiconductor device having plural memory units and a method of testing the semiconductor device are provided to improve test efficiency of the semiconductor device by reducing required resources in test equipment. A semiconductor device includes plural memory units(101,102,10M) and an input portion(110). Each of the memory units has plural input lines. The input unit provides a corresponding test signal to a corresponding input line of the input lines in the respective memory units, in response to a test enable signal. The input unit includes a buffer unit(112) and a switching unit(114). The buffer units store plural test signals from the test equipment and provide the corresponding test signal to the corresponding input line. The switching unit switches the corresponding test signal to the corresponding input line in response to the test enable signal.