发明名称 Method of manufacturing semiconductor device suitable for forming wiring using damascene method
摘要 A concave portion is formed in an interlayer insulating film formed on a semiconductor substrate. Then a first film of Mn is formed by CVD, the first film covering the inner surface of the concave portion and the upper surface of the insulating film. Then conductive material essentially consisting of Cu is deposited on the first film to embed the conductive material in the concave portion. Then the semiconductor substrate is annealed. During the period until a barrier layer is formed having also a function of improving tight adhesion, it is possible to ensure sufficient tight adhesion of wiring members and prevent peel-off of the wiring members.
申请公布号 US7413977(B2) 申请公布日期 2008.08.19
申请号 US20050318530 申请日期 2005.12.28
申请人 FUJITSU LIMITED 发明人 SHIMIZU NORIYOSHI;OHTSUKA NOBUYUKI;KITADA HIDEKI;NAKAO YOSHIYUKI
分类号 H01L21/4763 主分类号 H01L21/4763
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