发明名称 High k gate insulator removal
摘要 A method of forming a high k gate insulation layer in an integrated circuit on a substrate. A high k layer is deposited onto the substrate, and patterned with a mask to define the high k gate insulation layer and exposed portions of the high k layer. The exposed portions of the high k layer are subjected to an ion implanted species that causes lattice damage to the exposed portions of the high k layer. The lattice damaged exposed portions of the high k layer are etched to leave the high k gate insulation layer.
申请公布号 US7413996(B2) 申请公布日期 2008.08.19
申请号 US20030413051 申请日期 2003.04.14
申请人 LSI CORPORATION 发明人 KAMATH ARVIND;LO WAI;GOPINATH VENKATESH
分类号 H01L21/00;H01L21/28;H01L21/311;H01L29/51 主分类号 H01L21/00
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