发明名称 |
IMAGE SENSOR AND METHOD FOR MANUFACTURING THEREOF |
摘要 |
A method for fabricating an image sensor is provided to obtain higher amplification and embody a clearer image by effectively controlling the dark current of an image sensor. A CMOS image sensor(200) is formed. A cooling apparatus(100) is formed under the CMOS image sensor. A cooling part(300) is formed under the cooling apparatus. The process for forming the cooling apparatus can be formed by a process for forming a DC-type P-N junction thermoelectric semiconductor. The process for forming the thermoelectric semiconductor can include the following steps. A first insulation layer(120) is formed on a substrate. A first conductive layer(130) is formed on the first insulation layer, including a plurality of trenches to selectively expose the first insulation layer. An intrinsic layer is formed on the first conductive layer, filling the trenches. Ions of a first conductivity type are implanted into one region of the intrinsic layer to form a conductive layer(142) of the first conductivity type. Ions of a second conductivity type are implanted into the other region of the intrinsic layer to form a conductive layer(144) of the second conductivity type. The conductive layer of the first conductivity type can be electrically connected to the conductive layer of the second conductivity type by a second conductive layer. |
申请公布号 |
KR100853093(B1) |
申请公布日期 |
2008.08.19 |
申请号 |
KR20070024906 |
申请日期 |
2007.03.14 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
HAN, CHANG HUN |
分类号 |
H01L27/146;H01L23/34;H01L27/14 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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