发明名称 NON-VOLATILE MEMORY DEVICE WITH BUILT-IN TEST CONTROL UNIT AND METHODS OF TESTING AND REPAIRING A CELL ARRAY
摘要 A memory device including a cell array is disclosed. One embodiment includes a plurality of memory cells, wherein each memory cell is capable of showing at least two distinguishable states, a programmable read voltage source adapted to supply an alterable read voltage and a test control unit. The test control unit includes a voltage control unit that is capable of controlling the read voltage source, a counter unit that is capable of counting the memory cells exhibiting a predetermined state and an analysis unit that is capable of rating a currently determined number of memory cells exhibiting a predetermined state.
申请公布号 US2008195903(A1) 申请公布日期 2008.08.14
申请号 US20070674853 申请日期 2007.02.14
申请人 QIMONDA FLASH GMBH & CO. KG 发明人 ZIPPRICH-RASCH VOLKER
分类号 G11C29/44 主分类号 G11C29/44
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