发明名称 METHODS AND STRUCTURE FOR CHARGE DISSIPATION IN INTEGRATED CIRCUITS
摘要 Methods and structures and methods of designing structures for charge dissipation in an integrated circuit on an SOI substrate. A first structure includes a charge dissipation ring around a periphery of the integrated circuit chip and one or more charge dissipation pedestals physically and electrically connected to the charge dissipation pedestals. The silicon layer and bulk silicon layer of the SOI substrate are connected by the guard ring and the charge dissipation pedestals. The ground distribution grid of the integrated circuit chip is connected to an uppermost wire segment of one or more charge dissipation pedestals. A second structure, replaces the charge dissipation guard ring with additional charge dissipation pedestal elements.
申请公布号 US2008191309(A1) 申请公布日期 2008.08.14
申请号 US20080103212 申请日期 2008.04.15
申请人 发明人 DEVRIES KENNETH L.;GRECO NANCY ANNE;PRESTON JOAN;RUNYON STEPHEN LARRY
分类号 H01L23/58;G06F17/50;H01L21/762 主分类号 H01L23/58
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