发明名称 Fluorescent X-Ray Analysis Method and Device
摘要 In a fluorescent X-ray analysis method, a sample ( 1 ) is set on a sample stage ( 2 ) on an upper side of an X-ray irradiation chamber ( 7 ) and a sample cover ( 6 ) is closed from the upper part of the sample ( 1 ) to surround the sample ( 1 ), and then, a lower plane of the sample ( 1 ) is irradiated with X-ray for analysis. When the sample ( 1 ) is set on the sample stage ( 2 ) and the sample cover ( 6 ) is closed, a cover detecting means ( 8 ) detects that the sample cover ( 6 ) is closed and X-ray is automatically projected from an X-ray source ( 3 ) to start analysis.
申请公布号 US2008192888(A1) 申请公布日期 2008.08.14
申请号 US20060587930 申请日期 2006.10.26
申请人 IWAMOTO HIROSHI;TANI YOSHIYUKI;HISAZUMI TAKAO;IWATA YUKIHIRO;SAKAGUCHI ETSUYOSHI 发明人 IWAMOTO HIROSHI;TANI YOSHIYUKI;HISAZUMI TAKAO;IWATA YUKIHIRO;SAKAGUCHI ETSUYOSHI
分类号 G01N23/223 主分类号 G01N23/223
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