发明名称 Method and Apparatus for Inspecting Light-Emitting Element and Method and Apparatus for Burn-In
摘要 A method for inspecting a light-emitting element for a defect includes (a) measuring a light output of a light-emitting element while injecting a current into the light-emitting element, (b) setting a drive current according to an injected current and a measured light output, (c) measuring a light output while injecting the set drive current into the light-emitting element in a forward direction, and (d) determining whether or not the light-emitting element has a defect, according to the light output measured in step (c).
申请公布号 US2008191701(A1) 申请公布日期 2008.08.14
申请号 US20080024436 申请日期 2008.02.01
申请人 SEIKO EPSON CORPORATION 发明人 YAJIMA TAKESHI
分类号 G01R31/44 主分类号 G01R31/44
代理机构 代理人
主权项
地址