发明名称 Electrical test device for testing electrical test pieces
摘要 The invention relates to an electrical test device for testing electrical test pieces comprising at least one electrical contact system and at least one electrical connecting device provided with at least one electrical/electronic component, and having contact surfaces for touch contacting of the contact system which may be contacted by the test piece, and having a wiring substrate and a connecting element; wherein the electrical/electronic component is carried by the connecting element.
申请公布号 US2008191721(A1) 申请公布日期 2008.08.14
申请号 US20080069053 申请日期 2008.02.07
申请人 FEINMETALL GMBH 发明人 BOHM GUNTHER;STOLP PETER;STEIDLE GEORG
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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