METHOD AND ARRANGEMENT FOR DETECTING MECHANICAL DEFECTS IN A SEMICONDUCTOR COMPONENT, IN PARTICULAR A SOLAR CELL OR SOLAR CELL ARRANGEMENT

摘要

The invention relates to a method for detecting defects in a semiconductor component (10), in particular a solar cell or solar cell arrangement, having at least one pn junction (22) in a semiconductor layer of a semiconductor material (16) with an indirect band transition, wherein a voltage (23) for operating the pn junction (22) in the forward direction is applied (70) to the at least one pn junction (22), the radiation behaviour of the semiconductor layer, which is produced by the applied voltage (23), is optically detected (74) at least for partial regions of the semiconductor layer and is automatically examined (76) for essentially one-dimensional changes in intensity in order to detect mechanical defects.