发明名称 METHOD AND APPARATUS FOR AUTOMATIC TEST EQUIPMENT
摘要 The traditional device interface board is replaced by a number of smaller strips containing one or more electrical components for interfacing the device under test and the test head. The device interface modules may mount to a stiffening member having a back bone and multiple ribs running through the stiffening member. The device interface strips can create a lattice-like structure for the interface circuitry. Individual circuits may be disposed on the interface strips to perform functionality relating to the device under test and/or the test head.
申请公布号 KR20080074893(A) 申请公布日期 2008.08.13
申请号 KR20087011952 申请日期 2008.05.19
申请人 TERADYNE, INC. 发明人 PARRISH FRANK B.;CASTELLANO DEREK M.
分类号 G01R31/26;G01R31/28 主分类号 G01R31/26
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