发明名称 SEMICONDUCTOR SURFACE TREATMENT AGENT
摘要 <p>A semiconductor surface treatment agent containing a fluorine compound, a water-soluble organic solvent and an inorganic acid, with the balance being water and a method for manufacturing a semiconductor device by etching a high dielectric constant insulating material using the subject semiconductor surface treatment agent are provided. According to the present invention, it is possible to selectively and efficiently etch a high dielectric constant insulating material to be used in a transistor formation process of the semiconductor device manufacture; and it is also possible to achieve etching with ease within a short period of time even for a high dielectric constant insulating material to which etching is hardly applied.</p>
申请公布号 EP1956644(A1) 申请公布日期 2008.08.13
申请号 EP20060833742 申请日期 2006.11.30
申请人 MITSUBISHI GAS CHEMICAL COMPANY, INC. 发明人 YAGUCHI, KAZUYOSHI;SHIMADA, KENJI;ABE, KOJIRO
分类号 H01L21/308;H01L21/304;H01L29/78 主分类号 H01L21/308
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