发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
A method for manufacturing a semiconductor device is provided to improve a density and a surface roughness of a metal layer by depositing the metal layer on the whole surface of a substrate in the state that iodine is adhered to the substrate. A dielectric(210) is formed on a semiconductor substrate(200) to cover a lower structure. The dielectric is etched to form a pattern for a metal wire. A diffusion preventing barrier layer(212) is formed on the dielectric including the pattern for a metal wire. An iodine atom is adhered to the substrate surface on which the diffusion preventing barrier layer is formed. A first copper layer(220) is formed on the diffusion preventing barrier layer where the iodine atom is adhered along a profile of the pattern for a metal wire through a sputtering method. A second copper layer(230) gap-filling the pattern for the metal wire is formed on the first copper layer to form a metal wire. The pattern for a metal wire is a trench or a contact hole.
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申请公布号 |
KR20080074645(A) |
申请公布日期 |
2008.08.13 |
申请号 |
KR20070014038 |
申请日期 |
2007.02.09 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HWANG, EUI SEONG;KIM, JUN KI |
分类号 |
H01L21/203;H01L21/28 |
主分类号 |
H01L21/203 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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