发明名称 Method for manufacturing strained silicon
摘要 In accordance with a particular embodiment of the present invention, a method for manufacturing strained silicon is provided. In one embodiment, the method for manufacturing strained silicon includes inducing a curvature in a silicon wafer, depositing an epitaxial layer of silicon upon an upper surface of the silicon water while the silicon wafer is under the induced curvature, and releasing the silicon wafer from the induced curvature, after depositing the epitaxial layer, such that a strain is induced in the epitaxial layer.
申请公布号 US7410888(B2) 申请公布日期 2008.08.12
申请号 US20040027512 申请日期 2004.12.30
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 KNIPE RICHARD L.;ENDSLEY GRADY L.
分类号 H01L21/20 主分类号 H01L21/20
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