发明名称 Thin film transistor and manufacturing method thereof
摘要 The present invention provides a thin film transistor in which a substantial length of a channel is shortened to miniaturize a semiconductor device and a manufacturing method thereof. In addition, the present invention provides a semiconductor device which realizes high-speed operation and high-performance of the semiconductor device and a manufacturing method thereof. Further in addition, it is an object of the present invention to provide a manufacturing method in which a manufacturing process is simplified. The semiconductor device of the present invention has an island-shaped semiconductor film formed over a substrate having an insulating surface and a gate electrode formed over the island-shaped semiconductor film, in which the gate electrode is oxidized its surface by high-density plasma to be slimmed and the substantial length of a channel is shortened.
申请公布号 US7410839(B2) 申请公布日期 2008.08.12
申请号 US20060410071 申请日期 2006.04.25
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 ISOBE ATSUO;YAMAZAKI SHUNPEI
分类号 H01L21/84;H01L21/00;H01L21/336;H01L21/8234 主分类号 H01L21/84
代理机构 代理人
主权项
地址