发明名称 WAFER LEVEL SYSTEM IN PACKAGE AND FABRICATION METHOD THEREOF
摘要 <p>A wafer level system-in-package and a method for manufacturing the same are provided to significantly improve electric characteristics of a system by reducing a wire length with a logic device and a passive device. A method for manufacturing a wafer level system-in-package includes: forming a first rearrangement conductive layer(240) on an upper surface of a memory(200); forming a through hole(260) penetrating the memory; filling the through hole with a conductive material; forming a second rearrangement conductive layer(280) on a lower surface of the memory; and electrically connecting at least one system semiconductor device to the upper surface of the memory; and mounting at least one passive device on the upper surface of the memory.</p>
申请公布号 KR100851108(B1) 申请公布日期 2008.08.08
申请号 KR20070006413 申请日期 2007.01.22
申请人 发明人
分类号 H01L23/12 主分类号 H01L23/12
代理机构 代理人
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