发明名称 METHOD AND APPARATUS FOR MANUFACTURING A SEMICONDUCTOR
摘要 A method and an apparatus for manufacturing a semiconductor device are provided to increase a stress applied on a sidewall by contacting a stress liner along a surface of an amorphous region. A first layer(23) and a second layer(25) are formed on a semiconductor substrate. The first layer has a first crystal direction, while the second layer has a second crystal direction, which is different from the first crystal direction. A portion of the second layer is turned into an amorphous region. An external stress is applied on the second layer. The second layer is heated to a temperature higher than a re-crystallization temperature of the second layer. When the external stress is applied on the second layer, a stress liner is formed. A twisting force is applied on the second layer and a trench is formed in the semiconductor substrate.
申请公布号 KR20080073212(A) 申请公布日期 2008.08.08
申请号 KR20080007248 申请日期 2008.01.23
申请人 SAMSUNG ELECTRONICS CO., LTD.;INFINEON TECHNOLOGIES AG 发明人 KU, JA HUM;HIERLEMANN MATTHIAS
分类号 H01L29/775;H01L21/205;H01L21/324 主分类号 H01L29/775
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