发明名称 |
METHOD AND APPARATUS FOR MANUFACTURING A SEMICONDUCTOR |
摘要 |
A method and an apparatus for manufacturing a semiconductor device are provided to increase a stress applied on a sidewall by contacting a stress liner along a surface of an amorphous region. A first layer(23) and a second layer(25) are formed on a semiconductor substrate. The first layer has a first crystal direction, while the second layer has a second crystal direction, which is different from the first crystal direction. A portion of the second layer is turned into an amorphous region. An external stress is applied on the second layer. The second layer is heated to a temperature higher than a re-crystallization temperature of the second layer. When the external stress is applied on the second layer, a stress liner is formed. A twisting force is applied on the second layer and a trench is formed in the semiconductor substrate.
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申请公布号 |
KR20080073212(A) |
申请公布日期 |
2008.08.08 |
申请号 |
KR20080007248 |
申请日期 |
2008.01.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;INFINEON TECHNOLOGIES AG |
发明人 |
KU, JA HUM;HIERLEMANN MATTHIAS |
分类号 |
H01L29/775;H01L21/205;H01L21/324 |
主分类号 |
H01L29/775 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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