发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device having a contact liner film and equipped with a PMIS transistor which has a structure capable of supplying hydrogen to a gate insulating film effectively. <P>SOLUTION: The semiconductor device which has a P-type MIS transistor formed on an active region 100 includes a gate isolation 102 film; a gate electrode 103; a sidewall insulating film 112; a source-drain region 107; a contact liner film 109 formed so that the gate electrode 103 and the sidewall insulating film 112 might be covered; an interlayer insulating film 110; and a contact plug 111. The contact liner film 109 has a slit 109A prolonged from an upper face side to a corner at a position near the corner where the side face of the sidewall insulating film 112 and the upper face of the active region 100 cross with each other. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008182063(A) |
申请公布日期 |
2008.08.07 |
申请号 |
JP20070014553 |
申请日期 |
2007.01.25 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
TAKEOKA SHINJI |
分类号 |
H01L29/78;H01L21/768;H01L21/8234;H01L21/8242;H01L27/088;H01L27/10;H01L27/108 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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