发明名称 |
SUBSTRATE TREATING EQUIPMENT |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To prevent a substrate from being polluted with dust and a particle present in a suction passage in treating equipment using the method of holding the substrate by suction. <P>SOLUTION: Substrate treating equipment is constituted by providing a suction port 14 for sucking a wafer in a spin chuck 10 for holding the wafer W which is a substrate to be treated in such a manner that the wafer can be rotated and connecting a vacuum pump 20 to the suction port. In the substrate treating equipment, a dirt prevention means 40 for preventing the dirt of a suction passage 15a which connects the suction port in the spin chuck and the vacuum pump is provided. The dirt prevention means is formed of a filter member 41 arranged on a suction port side in the suction passage. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
申请公布号 |
JP2008182084(A) |
申请公布日期 |
2008.08.07 |
申请号 |
JP20070014884 |
申请日期 |
2007.01.25 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
INADA HIROICHI;SASAGAWA NORIHIKO |
分类号 |
H01L21/027;B08B3/02;B08B7/00;B08B11/02;G03F7/16;H01L21/683 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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