发明名称 SUBSTRATE TREATING EQUIPMENT
摘要 <p><P>PROBLEM TO BE SOLVED: To prevent a substrate from being polluted with dust and a particle present in a suction passage in treating equipment using the method of holding the substrate by suction. <P>SOLUTION: Substrate treating equipment is constituted by providing a suction port 14 for sucking a wafer in a spin chuck 10 for holding the wafer W which is a substrate to be treated in such a manner that the wafer can be rotated and connecting a vacuum pump 20 to the suction port. In the substrate treating equipment, a dirt prevention means 40 for preventing the dirt of a suction passage 15a which connects the suction port in the spin chuck and the vacuum pump is provided. The dirt prevention means is formed of a filter member 41 arranged on a suction port side in the suction passage. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008182084(A) 申请公布日期 2008.08.07
申请号 JP20070014884 申请日期 2007.01.25
申请人 TOKYO ELECTRON LTD 发明人 INADA HIROICHI;SASAGAWA NORIHIKO
分类号 H01L21/027;B08B3/02;B08B7/00;B08B11/02;G03F7/16;H01L21/683 主分类号 H01L21/027
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