发明名称 |
METHOD FOR MEASURING HYPOCHLORITE ION |
摘要 |
A method for measuring hypochlorite ion, which comprises the steps of. (A) reacting, with hypochlorite ion, a compound represented by the following general formula (I): wherein R<SUP>1 </SUP>represents a 2-carboxyphenyl group which may be substituted; R<SUP>2 </SUP>represents a phenyl group which is substituted with a substituted or unsubstituted amino group; X<SUP>1 </SUP>and X<SUP>2 </SUP>each independently represents either hydrogen atom or a halogen atom; or a salt thereof; and (B) measuring fluorescence of a dearylated compound generated in the aforementioned step (A) or a salt thereof.
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申请公布号 |
US2008188006(A1) |
申请公布日期 |
2008.08.07 |
申请号 |
US20080099979 |
申请日期 |
2008.04.09 |
申请人 |
TETSUO NAGANO;DAIICHI PURE CHEMICALS CO., LTD. |
发明人 |
SETSUKINAI KEN-ICHI;URANO YASUTERU;NAGANO TETSUO |
分类号 |
G01N33/00;G01N21/64;G01N21/77 |
主分类号 |
G01N33/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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