发明名称 METHOD FOR MEASURING HYPOCHLORITE ION
摘要 A method for measuring hypochlorite ion, which comprises the steps of. (A) reacting, with hypochlorite ion, a compound represented by the following general formula (I): wherein R<SUP>1 </SUP>represents a 2-carboxyphenyl group which may be substituted; R<SUP>2 </SUP>represents a phenyl group which is substituted with a substituted or unsubstituted amino group; X<SUP>1 </SUP>and X<SUP>2 </SUP>each independently represents either hydrogen atom or a halogen atom; or a salt thereof; and (B) measuring fluorescence of a dearylated compound generated in the aforementioned step (A) or a salt thereof.
申请公布号 US2008188006(A1) 申请公布日期 2008.08.07
申请号 US20080099979 申请日期 2008.04.09
申请人 TETSUO NAGANO;DAIICHI PURE CHEMICALS CO., LTD. 发明人 SETSUKINAI KEN-ICHI;URANO YASUTERU;NAGANO TETSUO
分类号 G01N33/00;G01N21/64;G01N21/77 主分类号 G01N33/00
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