发明名称 Photothermal Inspection Camera Having an Offset Adjusting Device
摘要 This photothermal examination camera ( 16 ) comprises: a system ( 22 ) for shaping a laser beam ( 4 ), which includes a device ( 40 ) for elongating the cross section of the beam in order to form, on a surface of a part ( 1 ) to be examined, an elongate heating zone along a direction; a matrix ( 8 ) of infrared detectors for detecting infrared radiation emitted by a detection zone on the surface ( 1 a) of the part ( 1 ) relative to the heating zone; and a signal processing unit ( 46 ) for processing the signals delivered by the infrared detectors in order to construct a thermographic image of the surface ( 1 a) of the part ( 1 ) by scanning the surface ( 1 a) with the heating zone. The camera includes a system for mechanically adjusting an offset between the elongate heating zone and the detection zone. Application to the non-destructive inspection of parts.
申请公布号 US2008185520(A1) 申请公布日期 2008.08.07
申请号 US20060912923 申请日期 2006.03.27
申请人 AREVA NP 发明人 PIRIOU MARC;LEGRANDJACQUES LAURENT
分类号 H01L25/00 主分类号 H01L25/00
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