发明名称 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE POSITIVE RESIST COMPOSITION
摘要 A positive resist composition comprises: (A) a compound capable of generating an acid upon irradiation with actinic rays or radiation; (B) a resin of which solubility in an alkali developer increases under action of an acid; and (C) a compound capable of decomposing under action of an acid to generate an acid.
申请公布号 WO2008093856(A1) 申请公布日期 2008.08.07
申请号 WO2008JP51698 申请日期 2008.01.28
申请人 FUJIFILM CORPORATION;WADA, KENJI 发明人 WADA, KENJI
分类号 G03F7/004;G03F7/039;G03F7/20 主分类号 G03F7/004
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