MONITOR BURN-IN TEST DEVICE AND MONITOR BURN-IN TEST METHOD

摘要

In a monitor burn-in test device (11), data is written all at once into a plurality of elements (16) requiring a refresh process. The refresh process is performed in the elements (16) after the write process. The data is held. When performing a read-out process, the refresh process is interrupted in the element (16) from which read-out is to be performed. Data is read out from the interrupted element (16). Thus, the refresh process is interrupted only in the element (16) from which read-out is to be performed. Accordingly, the refresh process can be continued in the element (16) other than the element from which read-out is to be performed. Thus, the data is surely held. The data write-in process may be completed at once. Thus, the monitor burn-in test can be effectively performed.