| 摘要 |
A probe card having a simple structure and an easy manufacturing process disclosed. The probe card includes a main substrate having a probe circuit pattern formed thereon; a needle fixing block provided with a connection plate located on a lower surface of the main substrate and a tip plate apart from and parallel to the connection plate; and a needle provided with an elastic bending portion located between the connection plate and the tip plate, a tip portion extending from a lower end of the elastic bending portion and being projected from a lower surface of the tip plate, and a connection portion extending from an upper end of the elastic bending portion and being electrically connected to the prove circuit pattern.
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