发明名称 Passivating coatings on exposed semiconductor surfaces
摘要 A semi-conductor such as silicon is coated with a layer of a dielectric compound such as SiO2, Al2O3, CeO2, Ta2O5, TiO2, ThO2, ZrO2 or MgF2 by a reactive sputtering process in which the metallic component of the dielectric compound forms the cathode and the other component forms the low pressure reacting gas. In an example, a coating of Al2O3 is formed in a silicon diode in an evacuated chamber by sputtering an aluminium cathode in an oxidizing atmosphere. Mixed dielectric coatings may be applied by sputtering material from a plurality of cathodes or from a single cathode consisting of a suitable alloy.
申请公布号 GB900334(A) 申请公布日期 1962.07.04
申请号 GB19600035736 申请日期 1960.10.18
申请人 ALLMANNA SVENSKA ELEKTRISKA AKTIEBOLAGET 发明人 BJORCK SVEN ERIK
分类号 H01L21/00;H01L21/316;H01L23/29 主分类号 H01L21/00
代理机构 代理人
主权项
地址