发明名称 Semiconductor device and method of manufacturing the same
摘要 <p>To reduce variation among TFTs in manufacture of a semiconductor device including n-type thin film transistors and p-type thin film transistors. Further, another object of the present invention is to reduce the number of masks and manufacturing steps, and manufacturing time. A method of manufacturing a semiconductor device includes forming an island-shaped semiconductor layer of a first thin film transistor, then, forming an island-shaped semiconductor layer of the second thin film transistor. In the formation of the island-shaped semiconductor layer of the second thin film transistor, a gate insulating film in contact with the island-shaped semiconductor layer of the second thin film transistor is used as a protection film (an etching stopper film) for the island-shaped semiconductor layer of the first thin film transistor.</p>
申请公布号 EP1953813(A2) 申请公布日期 2008.08.06
申请号 EP20080001057 申请日期 2008.01.21
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 HOSOYA, KUNIO;FUJIKAWA, SAISHI
分类号 H01L21/77;H01L27/12 主分类号 H01L21/77
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