发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>A semiconductor device and a manufacturing method thereof are provided to lower a writing voltage of the semiconductor device by using a laminate of a silicon film and germanium. A semiconductor device includes a memory device having a first electrode(11), a silicon film(13), a germanium film(14), and a second electrode(15). The silicon film is formed on the first electrode. The germanium film is formed on the silicon film. The second electrode is formed on the germanium film. The first and second electrodes are made of different materials. A work function of the material contained in the first electrode is greater than that of the material contained in the second material.</p>
申请公布号 KR20080072567(A) 申请公布日期 2008.08.06
申请号 KR20080010485 申请日期 2008.02.01
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 TOKUNAGA HAJIME;TAJIMA RYOTA
分类号 H01L29/786 主分类号 H01L29/786
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