| 摘要 |
A system and method for testing an integrated circuit is provided. In one embodiment, a method includes comparing the signal level of the output signal of the integrated circuit to the signal level of a reference signal, wherein a comparison signal is output, which has a first or a second value depending on whether the actual signal level of the output signal is above or below the actual signal level of the reference signal; determining the value of the comparison signal at a certain time; evaluating the value of the comparison signal determined at the time by way of a default; and outputting an error signal if the determined value of the comparison signal does not correspond to the default.
|
