发明名称 X-ray examination apparatus and radiation detector
摘要 The invention relates to an X-ray detector ( 1 ) with an array ( 2 ) of sensor elements ( 21 ), wherein each row (i) of sensor elements is connected via an addressing line to an addressing unit ( 5 ), and wherein each column j) of sensor elements is connected via a read-out line to a read-out unit ( 3 ). In the read-out unit ( 3 ), sensor signals are preprocessed, for example amplified by amplifiers ( 31 ). The detector further comprises a control unit ( 6 ) which is adapted to set the gains of said amplifiers ( 31 ) for each column (j) and each row (i) individually. The values of the gains may particularly be derived from a priori knowledge, from previous images of the object, or from the image signals of rows that have already been read out.
申请公布号 US7408166(B2) 申请公布日期 2008.08.05
申请号 US20050568271 申请日期 2005.04.25
申请人 KONINKLIJKE PHILIPS ELECTRONICS, N.V. 发明人 SCHAFER DIRK;ROSE GEORG;WIEGERT JENS;OVERDICK MICHAEL;RUTTEN WALTER
分类号 G01J1/24;H04N3/15;H04N5/32 主分类号 G01J1/24
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