发明名称 WAFER POLISHING DEVICE
摘要 A wafer polishing device is provided to improve the product yield of semiconductor devices by preventing a wafer from being scratched due to collision between a polishing head and a conditioner. A wafer polishing device comprises a polishing pad(36) for polishing a wafer(32), a platen(40) for fixing and rotating the polishing pad, and a polishing head(30) installed on the polishing pad. The wafer is provided below the polishing head. A first motor(38) is provided to rotate the polishing head. A conditioner head(44) fixes a conditioner pad(42) and is rotated by a second motor(46). The conditioner pad is attached to a bottom of the conditioner head for the purpose of conditioning of the polishing pad. The polishing head and the conditioner head are surrounded by a magnet.
申请公布号 KR20080071645(A) 申请公布日期 2008.08.05
申请号 KR20070009730 申请日期 2007.01.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KI, YOUNG HUN
分类号 B24B37/04;B24B53/017;H01L21/304 主分类号 B24B37/04
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