发明名称 |
Test apparatus and test method |
摘要 |
A test apparatus for testing a device under test 15 is provided. The test apparatus includes a driver 122 for applying a test signal to the device under test, a comparator 128 for comparing a result signal outputted by the device under test 15 corresponding to the applied test signal with a predetermined reference voltage and a setting voltage output section 110 for setting the voltage of the test signal to a predetermined voltage value to cause the driver 122 to terminate the transmission path of the result signal when the test apparatus reads from the device under test 15.
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申请公布号 |
US7409615(B2) |
申请公布日期 |
2008.08.05 |
申请号 |
US20060495186 |
申请日期 |
2006.07.28 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
NISHIMINE HIROAKI;NIIJIMA HIROKATSU;MIURA TAKEO |
分类号 |
G01R31/28;G01R31/319;G01R31/3193;G06F11/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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