发明名称 Test apparatus and test method
摘要 A test apparatus for testing a device under test 15 is provided. The test apparatus includes a driver 122 for applying a test signal to the device under test, a comparator 128 for comparing a result signal outputted by the device under test 15 corresponding to the applied test signal with a predetermined reference voltage and a setting voltage output section 110 for setting the voltage of the test signal to a predetermined voltage value to cause the driver 122 to terminate the transmission path of the result signal when the test apparatus reads from the device under test 15.
申请公布号 US7409615(B2) 申请公布日期 2008.08.05
申请号 US20060495186 申请日期 2006.07.28
申请人 ADVANTEST CORPORATION 发明人 NISHIMINE HIROAKI;NIIJIMA HIROKATSU;MIURA TAKEO
分类号 G01R31/28;G01R31/319;G01R31/3193;G06F11/00 主分类号 G01R31/28
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