<p>A method for manufacturing a flash memory device is provided to remove defects of a blocking insulating layer by performing a high-temperature heat treatment process and a low-temperature heat treatment process. A tunneling insulating layer(110) is formed on a semiconductor substrate(100). An electric charge storage layer(120) is formed on the tunneling insulating layer. A blocking insulting layer(130) is formed on the electric charge storage layer. A high-temperature heat treatment process is performed on the semiconductor substrate including the blocking insulating layer. A low-temperature heat treatment process is performed on the semiconductor substrate at atmosphere of 2-100 pressure. An oxygen defect and an interface defect of the blocking insulating layer are cured by using steam.</p>
申请公布号
KR20080071019(A)
申请公布日期
2008.08.01
申请号
KR20070009085
申请日期
2007.01.29
申请人
POONGSAN MICROTEC CO., LTD.
发明人
HWANG, HYUN SANG;PARK, HO KYUNG;CHANG, MAN;JO, MIN SEOK