发明名称 Mid-chamber gas distribution plate, tuned plasma flow control grid and electrode
摘要 A plasma reactor is provided for processing a workpiece such as a semiconductor wafer or a dielectric mask. The reactor chamber has a ceiling, a side wall and a workpiece support pedestal inside the chamber and facing the ceiling along an axis of symmetry and defining a chamber volume between the pedestal and the ceiling. An RF plasma source power applicator is provided at the ceiling. An in-situ electrode body inside the chamber lies divides the chamber into upper and lower chamber regions. The in-situ electrode comprises plural flow-through passages extending parallel to the axis and having different opening sizes, the passages being radially distributed by opening size in accordance with a desired radial distribution of gas flow resistance through the in-situ electrode body.
申请公布号 US2008178805(A1) 申请公布日期 2008.07.31
申请号 US20070998468 申请日期 2007.11.28
申请人 APPLIED MATERIALS, INC. 发明人 PATERSON ALEXANDER M.;HOLLAND JOHN P.;PANAGOPOULOS THEODOROS;HAMMOND EDWARD P.;HATCHER BRIAN K.;TODOROW VALENTIN N.;KATZ DAN
分类号 C23C16/513 主分类号 C23C16/513
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