| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve a problem wherein external terminals for inputting/outputting expected values increase if the number of peripherals increases. <P>SOLUTION: This microcontroller testing circuit has: a test register control part 120 connected to a common bus and capable of transmitting and receiving control signals and the expected values from the outside through the bus; a first register 138 receiving the expected value from the test register control part 120, temporarily holding the expected values and writing them into the peripherals through signal lines; and a second register 139 reading and temporarily holding the expected values after they are written, and transmitting the expected values to the test register control part 120. The expected values are input and output from the external terminal of the common bus. <P>COPYRIGHT: (C)2008,JPO&INPIT |
