PROBE AND ELECTRICAL CONNECTION DEVICE EMPLOYING IT

摘要

A probe with an alignment mark which is not influenced easily by the chips of an electrode being cut by the needle point. The probe comprises a base portion having a fixing end and extending in the direction receding from the fixing end, an arm portion elongating laterally from the base portion while being spaced apart from the fixing end in the extending direction of the base portion, a needle point portion projecting from the arm portion and having a needle formed at its projecting end, and an alignment mark for positioning the needle end. The arm portion has a flat plane area on the side opposite to the side where the fixing end of the base portion is located when viewed along the elongating direction of the arm portion. The needle portion is formed to project from the flat plane area and the alignment mark consists at least a part of the flat plane area.