发明名称 PROCESS FOR FABRICATING SEMICONDUCTOR ELEMENT, SEMICONDUCTOR ELEMENT, AND DELAY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a process for fabricating a semiconductor element having nondoped polysilicon which can be easily retested, and to provide a semiconductor element and a delay device. SOLUTION: An LDD portion is formed before forming the gate region of a transistor. Since the LDD portion is formed earlier, introduction of impurities to the gate region can be prevented under a state where the gate region and the LDD portion are overlapped. Since the impurities do not intrude into the gate region when the LDD portion is formed, diffusion of impurities into the gate region can be prevented even if high speed diffusion arises. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008177193(A) 申请公布日期 2008.07.31
申请号 JP20070006679 申请日期 2007.01.16
申请人 SEIKO EPSON CORP 发明人 TAGAKI MASATOSHI
分类号 H01L21/336;H01L21/28;H01L21/822;H01L27/04;H01L29/78 主分类号 H01L21/336
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