发明名称 CHART FOR INSPECTION AND INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a chart for inspection capable of proper inspection with a simple constitution, concerning the chart for inspection and an inspection device for performing inspection on a plurality of subject distances. SOLUTION: The chart 12 for inspecting a lens module 100 includes a transparent substrate 51, the first pattern section 53 provided on the first surface 51a of the transparent substrate 51, and the second pattern section 54 provided on the second surface 61b of the transparent substrate 51. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008175684(A) 申请公布日期 2008.07.31
申请号 JP20070009266 申请日期 2007.01.18
申请人 INTER ACTION CORP 发明人 MURAKAMI KENTARO;NISHIZAWA MITSUAKI
分类号 G01M11/02 主分类号 G01M11/02
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