发明名称 METHODS OF THIN FILM PROCESS
摘要 A method for forming a semiconductor structure includes forming a plurality of features across a surface of a substrate, with at least one space being between two adjacent features. A first dielectric layer is formed on the features and within the at least one space. A portion of the first dielectric layer interacts with a reactant derived from a first precursor and a second precursor to form a first solid product. The first solid product is decomposed to substantially remove the portion of the first dielectric layer. A second dielectric layer is formed to substantially fill the at least one space.
申请公布号 US2008182382(A1) 申请公布日期 2008.07.31
申请号 US20070947674 申请日期 2007.11.29
申请人 APPLIED MATERIALS, INC. 发明人 INGLE NITIN K.;TANG JING;ZHENG YI;YUAN ZHENG;GE ZHENBIN;LU XINLIANG;KAO CHIEN-TEH;BANTHIA VIKASH;MCCLINTOCK WILLIAM H.;CHANG MEI
分类号 H01L21/762 主分类号 H01L21/762
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