发明名称 VISUAL EXAMINATION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a visual examination device capable of accurately performing the judgment of a flaw and the classification of the flaw with respect to the flaw image detected from a printed image and capable of classifying the flaw image into a plurality of kinds. <P>SOLUTION: This visual examination device is equipped with a flaw image detector 20 for detecting the flaw image from the photographed image acquired by an imaging device 10 and a flaw classifier 30 for extracting a plurality of kinds of feature quantities from the flaw image and classifying the flaw image into a plurality of preliminarily prescribed kinds on the basis of the combination of the feature quantities. The flaw classifier 30 is equipped with a together formed histogram forming part 42 for forming as together formed histogram on the basis of the combination of the brightnesses between a plurality of points in the flaw image, a feature extraction circuit 40 for subjecting the flaw image to filtering processing to extract a feature and analyzing the together formed histogram image to extract a feature, a feature quantity extraction circuit 60 for extracting a plurality of kinds of the feature quantities from the features obtained by the feature extraction circuit and a flaw classification circuit 70 for classifying the flaw image into a plurality of the preliminarily prescribed kinds on the basis of the combination of a plurality of kinds of the feature quantities obtained by the feature quantity extraction circuit. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008175588(A) 申请公布日期 2008.07.31
申请号 JP20070007329 申请日期 2007.01.16
申请人 KAGAWA UNIV;FUTEC INC 发明人 HATA SEIJI
分类号 G01N21/88;G01N21/892;G06T1/00;G06T7/00 主分类号 G01N21/88
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