发明名称 METHOD AND DEVICE FOR PARAMETERIZATION OF MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To parameterize a measuring device with neither special formation of an interface nor additional wiring. SOLUTION: In the measuring device, the measured values of a measured value detector 10 are transmitted to an evaluation unit via an output device 12. Parameters of the measuring device are stored in a memory 18. Parameters for parameterization can be stored in the memory 18 from the evaluation unit through a data line for transmitting the measured values. The output device 12 is therefore switched to high impedance for the data line Z. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008176794(A) 申请公布日期 2008.07.31
申请号 JP20080010424 申请日期 2008.01.21
申请人 SICK STEGMANN GMBH 发明人 SIRAKY JOSEF;STOBBE WILLIBALD;STEINMANN RALF
分类号 G08C19/00 主分类号 G08C19/00
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