发明名称 Scintillation evaluation method and device thereof
摘要 A scintillation evaluation method for quantitatively evaluating scintillation, the method comprising: obtaining an image data that includes at least an interference pattern of scintillation; increasing the contrast of the interference pattern; and determining the amount of variation of brightness in the image data, the amount of the variation corresponding to the interference pattern whose contrast has been increased.
申请公布号 US2008181483(A1) 申请公布日期 2008.07.31
申请号 US20080007566 申请日期 2008.01.11
申请人 SEIKO EPSON CORPORATION 发明人 SEKI HIDEYA
分类号 G06K9/00 主分类号 G06K9/00
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