| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing device for a semiconductor chip, capable of testing correctly an object to be tested, by simple regulation, even when a kind or state of the object to be tested varies, or even when one part of a contact unit develops trouble. SOLUTION: The contact unit 2 has a base block 20, and a plurality of contact parts 21 attached respectively independently and position-regulatably onto the base block 20 to be arrayed along a tape longitudinal direction of the object to be tested. The contact parts 21 are provided by the number same to the prescribed number of semiconductor chips along the tape longitudinal direction, so as to correspond to the respective semiconductor chips as to the tape longitudinal direction. COPYRIGHT: (C)2008,JPO&INPIT
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