发明名称 SYSTEM AND METHOD FOR TESTING POWER INTENSIFY OF RFID TAGS
摘要 The invention provides a system and method for testing the power intensity of RFID tags. The method is applicable to the system for testing power intensity, which comprises a RFID reading device, a signal transmitting device electrically coupled to the RFID reading device, a signal separating device electrically coupled to the signal transmitting device and a control analysis device electrically coupled to the signal separating device. The system is applicable to a RFID tag or a test object attached with a RFID tag in a non-shielded or shielded room.
申请公布号 US2008183407(A1) 申请公布日期 2008.07.31
申请号 US20070964647 申请日期 2007.12.26
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 YEH HSIN-HSIEN;HUNG YING-CHANG;LIN HONG-CHING
分类号 G01R21/06;G01N37/00;G01R31/00;G08B13/14;H04Q5/22 主分类号 G01R21/06
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