发明名称 Impedanzmesssystem mit integrierten internen Messdriftkompensationsnetzwerken
摘要 <p>The present technology provides an Impedance Measurement System (ZMS) for measuring the complex impedance of each well of a single well or multiwell microtiter plate utilizing a novel combination of parallel impedance measurement channels, multiplexing, and reference impedance networks, allowing internal correction of impedance measurement drift, maximized measurement accuracy, and minimized system size.</p>
申请公布号 DE112006000942(T5) 申请公布日期 2008.07.31
申请号 DE20061100942T 申请日期 2006.09.07
申请人 MDS ANALYTICAL TECHNOLOGIES, A BUSINESS UNIT OF MDS INC. 发明人 JONES, DAVID;LEIGH-JONES, PETER;KUPERSHOEK, DIRK
分类号 G01R27/02 主分类号 G01R27/02
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