发明名称 |
Impedanzmesssystem mit integrierten internen Messdriftkompensationsnetzwerken |
摘要 |
<p>The present technology provides an Impedance Measurement System (ZMS) for measuring the complex impedance of each well of a single well or multiwell microtiter plate utilizing a novel combination of parallel impedance measurement channels, multiplexing, and reference impedance networks, allowing internal correction of impedance measurement drift, maximized measurement accuracy, and minimized system size.</p> |
申请公布号 |
DE112006000942(T5) |
申请公布日期 |
2008.07.31 |
申请号 |
DE20061100942T |
申请日期 |
2006.09.07 |
申请人 |
MDS ANALYTICAL TECHNOLOGIES, A BUSINESS UNIT OF MDS INC. |
发明人 |
JONES, DAVID;LEIGH-JONES, PETER;KUPERSHOEK, DIRK |
分类号 |
G01R27/02 |
主分类号 |
G01R27/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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