发明名称 COMPOUND SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a compound semiconductor wafer including a notch at the external circumferential part thereof and allowing identification of the surface and backside. SOLUTION: The compound semiconductor wafer includes the notch 3 for identifying orientation at the external circumferential part thereof and also includes a chamfered part 14 at the external circumferential part of both surfaces 15, 16 of the wafer. Grinding traces 17, 18 that are different in the grinding direction are formed on the chamfered part 14 of both surfaces 15, 16 of the wafer. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008177287(A) 申请公布日期 2008.07.31
申请号 JP20070008248 申请日期 2007.01.17
申请人 HITACHI CABLE LTD 发明人 SUZUKI TAKASHI
分类号 H01L21/304;B24B9/00;H01L21/02 主分类号 H01L21/304
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