发明名称 Semiconductor device and method of fabricating the same
摘要 This invention efficiently suppresses the power noise of an LSI. A semiconductor device includes first and second interconnection layers. The first interconnection layer has a source voltage supply line of a first potential positioned to extend along logic cells in a first direction. The second interconnection layer lies on an upper layer than the first interconnection layer and has plural source voltage supply lines of a second potential arranged adjacent to each other to form a group and positioned to extend in a second direction which is different from the first direction of interconnection. An interconnection line of the second potential is positioned on an upper layer than the first interconnection layer and interconnects at least two of the plurality of source voltage supply lines of the second potential. The interconnection line of the second potential is positioned to overlap the source voltage supply line of the first potential, to form a capacitor with the source voltage supply line of the first potential.
申请公布号 US2008180132(A1) 申请公布日期 2008.07.31
申请号 US20080010265 申请日期 2008.01.23
申请人 NEC ELECTRONICS CORPORATION 发明人 ISHIKAWA HIROTAKA
分类号 H03K19/00 主分类号 H03K19/00
代理机构 代理人
主权项
地址