摘要 |
PROBLEM TO BE SOLVED: To provide a timing verification method, capable of performing accurate timing verification according to a wiring structure of a semiconductor integrated circuit device. SOLUTION: The method comprises a coefficient calculation process provided with a first storage means for storing, for wiring of a standard shape, a table of wiring resistance dispersion and wiring capacity dispersion according to the shape of the wiring for extracting a wiring structure in a signal path, extracting the wiring resistance dispersion and wiring capacity dispersion according to the wiring structure from the table, and obtaining a coefficient from the wiring resistance dispersion and wiring capacity dispersion extracted from the table. A delay time of signal propagation in the signal path is determined based on the coefficient. COPYRIGHT: (C)2008,JPO&INPIT
|